Laser solutions for integrated circuits testing
For more than 10 years, ALPhANOV has been developing optical and laser solutions for integrated circuits testing. Discover here the top-of-the-range and high-precision equipment for fault injection by laser, analysis of photonic emissions of integrated circuits or thermal stimulation by laser for reading the condition of transistors.
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Our related collaborative projects
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ASCRIPT - Safety Analysis of Integrated Circuits by PhotoThermal Effect
Developing new methods of evaluation and safety improvements for integrated circuits concerning an imaging technique that uses a laser as a heat source.
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PILAS - Advanced Laser Injection for Security Analyses
Develop an injection system and methodology for advanced multipoint faults using three to four laser beams.
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